Multitest joined the panel discussion during the Global STC Conference at San Diego. Rick Nelson, Editor in Chief for EDN and Test & Measurement World, moderated the spirited session. The panelists included Guenther Jeserer, business unit manager at Multitest, as well as representatives from Advantest, LTX and Teradyne. Most of the discussion centred on the challenges and benefits of standardized interfaces to automatic test equipment (ATE).

The successful third annual Global STC Conference (GSC) was held June 4 to 6, 2008. The conference theme, “Collaborative Solutions Beyond 2010,” provided the basis for three days of insightful presentations and networking with industry colleagues from around the world. In all, 24 speakers and panelists provided provocative viewpoints that led to many lively questions and discussions.

About the Semiconductor Test Consortium (STC)
The Semiconductor Test Consortium was founded in 2003 to develop a common test architecture that is completely open, documented and supported via solutions available from all ATE vendors. Open to all companies throughout the semiconductor supply chain with a vested interest in the test sector, the consortium is focused on providing value-added standards that deliver technical & economic benefits to the global semiconductor industry.