Given the fact that more and more players are entering the MEMS arena, all manufacturers are increasingly feeling the price pressure.
It seems like there was only one answer to address the decreasing cost expectations of the market while the over all test requirements are increasing: The standardization of the test handling equipment and a modular design that allows multiple sensor test with the same basic handler.
Multitest’s standardized MEMS test concept is providing a standard ASIC test handler that is extendable for MEMS test.
- A standard strip test-handling platform is conditioning the devices with temperature (from –55°C up to +155° C ) and reliable device contacting.
- Stimulus modules specific to sensor application will get added to the handler dependent on the sensor requirements.
- Both systems can get converted for different package types.
Multitest offers a rich portfolio of various MEMS test and calibration applications for single device handling:
- Accelerometer test up to 100 g for various axis (x,y,z,45deg,x+y)
- Accelerometer test for 3 axis low g MEMS
- Yaw rate sensor test with constant velocity or sinusoidal stimulus
- Pressure sensor test with up to 5 pressure set points
- Optical sensor test
- Electro magnetic sensor test
The modular MEMS test cart can receive two exchangeable stimulus boxes for the different sensor types. The stimulus boxes itself are kitable for different package types and provide 2 contact sites each, adding up to a quad site test.
Multitest also offers a similar standardized MEMS test concept for its strip test platform InStrip®, where high parallel test is supported for up to 1200 signals parallel. This could e.g. result in a test parallelism of 60 MEMS devices bringing advantages for packages with long test times.
There are two stimulus modules available for this high parallel test platform:
- Pressure test up to 20 bar to switch between 5 different pressure levels from –40°C to +135°C
- Accelerometer test for 3 axis low g MEMS from –40°C to +125°C
