For the first time Multitest will participate at Micromachine/MEMS show in Tokyo, July 30 to August 1, together with InTest company, the Japanese representative of Multitest, at booth number W2 – 13.

Multitest will exhibit its modular MEMS test concept with two different exemplary stimulus modules – for accelerometer and low-g test.

In addition Dr. Arnfried Kiermeier, Product Manger MEMS, will hold a presentation in the concurrent program. The session about “Physical stimulation during final test of MEMS sensors” will start at 10:30 am on July, 31.