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Increased Test Efficiency
New Pick & Place Method >>
Standardization of Sensor Test
Coping with cost pressure and advanced test requirements >>
First InStrip® in Taiwan
The Multitest strip test handler is successfully entering a new region >>
Cost of Test Calculator
MT MEMS
Test Module

Winner of the:
> Test & Measurement World's "Best in Test" 2007 Award
Read more about the winning product: InFlip MEMS >>
Features:

  • modularity replaces cost-intensive custom designed machinery 
  • standard handler plus sensor module 
  • increased reliability, quicker availability, cost-effectiveness, reduced floor space, worldwide support  
  • tri-temp solution  
  • special contacting solutions for sensor testing  
Handling Solution for:

  • SO and MLF devices with a pitch down to 0.5mm  
  • quad site testing  
  • tri-temp from –55 to 155°C  
  • bar and dot matrix code reading 
Realized Solutions:

  • high and low g accelerometers  
  • pressure sensors  
  • gyro scopes 
  • optical sensors  
  • magnetic sensors 
  • MEMS strip test module 
 
 
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