Find the downloads of the expert presentations at Semicon Europa at our website!

Subjects

• "New strategies for functional final test of multiple MEMS sensor types within one package" by Andreas Nagy at MEMS/MST Forum  
• "Test Sockets – addressing the challenges of lead-free packages" by Gerhard Gschwendtberger at the European Manufacturing Test Conference 
• "New Benchmarks in Final Test" by Günther Jeserer at Semi Technology Arena 
• "Test Sockets for Best Cost of Test" by Gerhard Gschwendtberger at Semi Technology Arena